Перегляд за автором "Kravets, V.G."

Сортувати за: Порядок: Результатів:

  • Kravets, V.G.; Vinnichenko, K.L.; Prygun, O.V. (Semiconductor Physics Quantum Electronics & Optoelectronics, 2000)
    Efficiency of medium choice for optical information recording is generally determined by homogeneity degree of material on the recording surface and by its structure on the film depth. In this respect pyrosolynes should ...
  • Beliak, I.V.; Kravets, V.G.; Kryuchin, A.A. (Semiconductor Physics Quantum Electronics & Optoelectronics, 2007)
    A physicotechnical fundamental of the multilayer photoluminescent media development has been considered. The quantum yield and relaxation time of luminescence were found as most significant values of the recording material. ...
  • Kravets, V.G.; Poperenko, L.V.; Yurgelevich, I.V.; Petford-Long, A.K. (Semiconductor Physics Quantum Electronics & Optoelectronics, 2002)
    It was found that optical and magneto-optical (MO) properties of thin film materials have potential application for blue laser recording. For this purpose, we have used a combination of ellipsometric and polar MO Kerr ...
  • Rozouvan, T.S.; Poperenko, L.V.; Kravets, V.G.; Shaykevich, I.A. (Semiconductor Physics Quantum Electronics & Optoelectronics, 2016)
    Optical properties and surface structure of graphene films grown on thin 1-μm copper layer using the chemical vapor deposition method were investigated applying spectroscopic ellipsometry and nanoscopic measurements. ...
  • Poperenko, L.V.; Kravets, V.G.; Lysenko, S.I.; Vinnichenko, K.L. (Functional Materials, 2006)
    Modification of the microrelief and structure of a CO-based amorphous metal alloy ribbon surface layers after thermal treatment at elevated and cryogenic temperatures and under an external magnetic field has been studied ...
  • Kravets, V.G.; Poperenko, L.V.; Vinnichenko, K.L. (Functional Materials, 2005)
    Feₓ(Si0₂)₁₋ₓ magnetic granular films below the percolation threshold (х < 0.45) have been studied using tunneling magnetoresistance (TMR), magnetorefractive effect (MRE), and X-ray photoelectron spectroscopy. Maximum ...
  • Kravets, V.G.; Gorbov, I.V. (Semiconductor Physics Quantum Electronics & Optoelectronics, 2008)
    We studied the relief depth of the data layer formed in a glass disk by ion beam etching process with using classical ellipsometry at the constant wavelength 632.8 nm for different angles of incidence. It was found that ...